Structure-Performance relationship from operando measurements

Description

The aim is to study the local atomic structure or composition and relate it to device
performance under operando conditions.

Multimodal analysis: X-ray beam induced current (XBIC) measurements have
successfully been combined with X-ray fluorescence (XRF), to correlate the electrical performance with composition. The results give insights into how the (nanoscale) composition may be correlated to electrical performance with (sub)grain size resolution in real solar cells.

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